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Micron Technology Inc Patents
What Micron Technology Inc has filed at the patent office — applications as well as grants, because a filing is on the record eighteen months before anyone has to say what it was for.
MU on carbonthat →Filings on file
119
Granted
0
Still pending
119
Filed under
2 names
119 filings
Newest filing first. A pending application has no patent number yet, and most never get one.
| Invention | Patent |
|---|---|
| MEMORY DEVICE WITH ASYMMETRIC PASS THROUGH VOLTAGE FOR READ OPERATIONSG06F 3/0619, G11C 11/5671, G06F 3/0655, G06F 3/0679, G11C 16/0483, G11C 16/08, G11C 16/26, G11C 16/3427, G11C 16/3459, G11C2211/5621, G11C2211/5648Filed as Micron Technology, Inc.2026-06-23Augusto Benvenuti | pending |
| SEMICONDUCTOR DEVICE ASSEMBLIES WITH CAVITY-EMBEDDED CUBES AND LOGIC-SUPPORTING INTERPOSERSH10W 90/00, H10W 70/68, H10B 80/00, H10W 72/877, H10W 20/493, H10W 90/701, H10W 90/732, H10W 70/685, H10W 74/15, H10W 76/15, H10W 72/851, H10W 70/65, H10W 20/20, H10W 40/10, H10W 70/682, H10W 74/00, H10W 90/401, H10W 90/724, H10W 72/30, H10W 90/288, H10W 90/722, H10W 90/734, H10W 70/60, H10W 70/641, H10W 74/117, H10W 70/611Filed as Micron Technology, Inc.2026-06-22Kunal R. Parekh | pending |
| MEMORY DEVICES WITH MULTIPLE PSEUDO-CHANNELSG06F 13/1689, G06F 13/1694, G06F 11/0787, G06F 13/38, G06F 13/409, G11C 5/04, G11C 11/4093Filed as Micron Technology, Inc.2026-06-22Matthew A. Prather | pending |
| SELECTIVE USE OF A WORD LINE MONITORING PROCEDURE FOR RELIABILITY-RISK WORD LINESG11C 16/3459, G11C 16/349, G11C 11/5628, G11C 16/0483, G11C 16/08, G11C 16/10, G11C 16/3418, G11C 16/3427Filed as Micron Technology, Inc.2026-06-22Yu-Chung LIEN | pending |
| AGGREGATING UNALIGNED SEQUENTIAL WRITE REQUESTSG06F 3/0659, G06F 3/0604, G06F 3/0679Filed as Micron Technology, Inc.2026-06-22Zhijia Yang | pending |
| CONNECTING SEMICONDUCTOR DIES THROUGH TRACESH10W 90/00, H10W 72/0198, H10W 72/527, H10W 74/15, H10W 72/07552, H10W 72/851, H10W 72/834, H10W 72/531, H10W 90/297, H10W 90/724, H10W 72/07553, H10W 72/521, H10W 72/537, H10W 90/722, H10W 90/734, H10W 90/752, H10W 70/09Filed as Micron Technology, Inc.2026-06-22Terrence B. McDaniel | pending |
| DATA THROUGHPUT USING A METAL BRACKETG06F 1/20, G06F 1/206, H05K 7/205, G06F 1/185, G06F 1/3206, G06F 1/3243, G06F 1/3275, H05K 1/0215, H05K 1/18, H05K 7/20509, H05K2201/09163, H05K2201/10159Filed as Micron Technology, Inc.2026-06-19Deepu Narasimiah Subhash | pending |
| Memory ArraysFiled as Micron Technology, Inc.2026-06-18Martin C. Roberts | pending |
| SELF-CALIBRATION IN A MEMORY DEVICEG11C 29/1201, G11C 29/42, G11C 29/021, G11C 29/022, G11C 29/028, G11C 29/12005Filed as Micron Technology, Inc.2026-06-18Jennifer E. Taylor | pending |
| DETECTION AND MITIGATION OF ATTACKS ON ROW HAMMER MITIGATION CIRCUITSG11C 11/40611, G11C 11/4078, G11C 16/08, G11C 11/40603, G11C 11/40615, G11C 11/40622, G11C 11/408Filed as Micron Technology, Inc.2026-06-18Sujeet Ayyapureddi | pending |
| ALTERNATIVE ERASE SCHEMES FOR RELIABILITY-RISK WORD LINESG11C 16/08, G11C 16/3418, G11C 11/5635, G11C 16/0483, G11C 16/16, G11C 16/3445Filed as Micron Technology, Inc.2026-06-17Yu-Chung LIEN | pending |
| RESAMPLE START VOLTAGE FOR CALIBRATION IN A PROGRAM OPERATION IMPROVEMENTG11C 16/102, G11C 16/26, G11C 16/0483, G11C 16/3404, G11C2207/2254Filed as Micron Technology, Inc.2026-06-17Edric Goh | pending |
| ATOMIC OPERATIONS IMPLEMENTED USING MEMORY SERVICES OF DATA STORAGE DEVICESG06F 3/0619, G06F 3/0659, G06F 3/0679, G06F 12/0815, G06F 12/0868Filed as Micron Technology, Inc.2026-06-16Luca Bert | pending |
| MANAGING ALLOCATION OF SUB-BLOCKS IN A MEMORY SUB-SYSTEMG06F 3/0619, G06F 3/064, G06F 3/0679, G06F 12/0246, G06F 12/0284, G06F 12/0292, G06F 12/1009, G06F2212/1008, G06F2212/1024, G06F2212/1032, G06F2212/7201, G06F2212/7208, G11C 16/08, G11C 16/10, G11C 16/32, G11C2216/16Filed as Micron Technology, Inc.2026-06-16Yu-Chung Lien | pending |
| OPTIMIZATION OF SOFT BIT WINDOWS BASED ON SIGNAL AND NOISE CHARACTERISTICS OF MEMORY CELLSG11C 11/5642, G06N 20/00, G06F 18/214, G06N 5/046, G11C 7/02, G11C 16/26, G11C 29/021, G11C 29/028, G11C 29/12005, G11C 29/14, G11C 29/38Filed as Micron Technology, Inc.2026-06-16James Fitzpatrick | pending |
| HYBRID CACHE COHERENCYG06F 12/0802, G06F 12/0895, G06F 12/0284, G06F 12/0813, G06F 12/0815, G06F 12/0837, G06F 12/0855, G06F 12/0864, G06F 13/1668, G06F2212/1008, G06F2212/1024, G06F2212/1056, G06F2212/254, G06F2212/60Filed as Micron Technology, Inc.2026-06-16Tony M. Brewer | pending |
| LOCKED RAID MEMORY DEVICESG06F 11/1004, G06F 11/108, G06F 11/1068Filed as Micron Technology, Inc.2026-06-16Marco Sforzin | pending |
| VOLTAGE SCALING BASED ON ERROR RATE FLUCTUATIONSG11C 29/12, G11C 29/44, Y02D 10/00, G11C 7/04, G11C 29/021, G11C 29/028, G11C 29/12005, G11C 29/36Filed as Micron Technology, Inc.2026-06-15Leon Zlotnik | pending |
| SEMICONDUCTOR MEMORY DEVICE WITH PROCESSING-IN-MEMORY USING TEST CIRCUITRYG11C 7/1069, G11C 29/36, G11C 5/025, G11C 5/04, G11C 7/1006, G11C 7/1096, G11C 29/14, G11C 29/16, G11C 29/48, G11C2029/3602Filed as Micron Technology, Inc.2026-06-15Shadden Kerstetter | pending |
| CRITICAL TIMING DRIVEN ADAPTIVE VOLTAGE FREQUENCY SCALINGG06F 1/04, G11C 7/1069, G11C 7/222, G06F 1/12, G06F 15/7807, G11C 7/106Filed as Micron Technology, Inc.2026-06-15Leon Zlotnik | pending |
| SEMICONDUCTOR DEVICES, ASSEMBLIES, AND ASSOCIATED METHODSH10W 90/00, H10W 72/50, H10W 72/922, H10W 70/65, H10W 90/20, H10W 90/754, H10W 90/752, H10W 70/652, H10W 90/24, H10W 90/751Filed as Micron Technology, Inc.2026-06-15Raj K. Bansal | pending |
| ANTENNA PROTECTION ON DUMMY METAL FILLSH10W 42/60, H10W 42/00, H10W 20/40Filed as Micron Technology, Inc.2026-06-15Hao Chen | pending |
| PATTERNING OF 3D NAND PILLARS AND FLYING BUTTRESS SUPPORTS WITH THREE STRIPE TECHNIQUEH10B 41/27, H10W 42/121, H10B 43/27, H10P 50/71, H10P 50/695Filed as Micron Technology, Inc.2026-06-12Anton P. Eppich | pending |
| STACKED SEMICONDUCTOR DIE ASSEMBLIES WITH DIE SUPPORT MEMBERS AND ASSOCIATED SYSTEMS AND METHODSH10W 90/00, H10P 54/00, H10W 72/07337, H10W 90/291, H10W 90/732, H10W 72/354, H10W 72/884, H10W 72/01515, H10W 72/073, H10W 72/932, H10W 72/951, H10W 72/075, H10W 90/20, H10W 70/655, H10W 74/00, H10W 90/754, H10W 72/07327, H10W 72/30, H10W 46/00, H10W 90/734, H10W 72/5449, H10W 74/117, H10W 90/24Filed as Micron Technology, Inc.2026-06-12Seng Kim Ye | pending |
| APPARATUS WITH STORAGE CONNECTION MECHANISM AND METHODS FOR OPERATING THE SAMEG06F 12/0246, G06F 3/0607, G06F 3/0659, G06F 3/0688, G06F 13/4247, G06F2212/1016, G06F2212/1044, G06F2212/7201, G06F2212/7208Filed as Micron Technology, Inc.2026-06-12Jonathan R. Hinkle | pending |
| DRIFT COMPENSATION FOR CODEWORDS IN MEMORYG11C 16/102, G11C 16/26, G11C 16/3404, G11C 16/12, G11C 16/3486, G11C 16/3495, G11C 29/021, G11C 29/028, G11C 29/52Filed as Micron Technology, Inc.2026-06-12Marco Sforzin | pending |
| BIAS VOLTAGE CONTROL FOR SUB-BLOCK GROUPS IN A MEMORY DEVICEG11C 16/08, G11C 16/102, G11C 11/5628, G11C 16/0483, G11C 16/10, G11C 16/32, G11C 16/3404, G11C 16/3427Filed as Micron Technology, Inc.2026-06-11Taehyun Kim | pending |
| IMAGE SENSOR SELECTIONH04N 23/45, H04N 23/64, H04N 23/57, H04N 23/50, H04N 23/90, H04N 23/632, H04N 23/62Filed as Micron Technology, Inc.2026-06-11Marta Egorova | pending |
| MEMORY ARCHITECTURE FOR BLOCK MIGRATION IN ZNSG06F 3/0647, G06F 3/0604, G06F 3/061, G06F 3/0679, G06F2212/1016Filed as Micron Technology, Inc.2026-06-11Paul Stonelake | pending |
| USE MODEL STATISTICS STORAGE IN A MEMORY SUBSYSTEMG06F 11/0727, G06F 11/3037, G06F 3/0653, G06F 3/0679, G06F 11/076, G06F 11/1441, G06F 11/3034, G06F 11/3058, G06F 11/3447, G06F 11/3452, G06F2201/88Filed as Micron Technology, Inc.2026-06-10Ryan G. Fisher | pending |
| HANDLING POWER-LOSS RESET EVENTS WITH BAD BLOCK RISK MITIGATIONG11C 29/1201, G11C 29/44, G11C 29/38, G11C 29/46Filed as Micron Technology, Inc.2026-06-10Scott Anthony Stoller | pending |
| SCHEDULING SCAN OPERATIONS IN MEMORY SUB-SYSTEMSG11C 29/10, G11C 29/1201, G11C 29/028, G11C 29/12015Filed as Micron Technology, Inc.2026-06-09Yang Liu | pending |
| DEBUG AND RECOVERY OPERATIONS FOR NON-REMOVABLE MEMORY SUB-SYSTEMSG06F 11/0778, G06F 11/1068, G11C 29/56, G06F 11/0727, G06F 11/0775, G06F 11/079, G06F 11/0793, G06F 11/2007, G06F 21/79Filed as Micron Technology, Inc.2026-06-09Nicholas Terence Heath | pending |
| TEMPERATURE-BASED WORDLINE LEAKAGE TESTING FOR MEMORY DEVICESG06F 3/064, G11C 29/025, G06F 3/0604, G06F 3/0653, G06F 3/0679, G06F 12/0246, G06F 12/0646, G06F2212/1008, G06F2212/1032, G06F2212/1044, G06F2212/7202, G06F2212/7204, G06F2212/7205, G06F2212/7206, G11C 7/02, G11C 29/50, G11C2029/1202, G11C2029/5006Filed as MICRON TECHNOLOGY, INC.2026-06-08Wai Leong Chin | pending |
| MEMORY DEVICE ASSEMBLY WITH A LEAKER DEVICEH10B 53/30, H10D 1/716, H10B 12/03, H10D 1/711, G11C 11/221Filed as Micron Technology, Inc.2026-06-08Ashonita A. CHAVAN | pending |
| ADVANCED INTERCONNECTION FOR WAFER ON WAFER PACKAGINGH10W 20/20, H10W 20/023, H10B 80/00, H10B 43/40, H10B 43/27, H10W 20/481, H10W 90/00, H10W 20/0234, H10W 80/312, H10W 20/2134, H10W 20/0238, H10W 90/297, H10W 20/42, H10W 80/327, H10W 90/792, H10W 20/0242, H10W 20/0253, H10W 20/0265Filed as Micron Technology, Inc.2026-06-08Shyam Surthi | pending |
| OPTIMIZED SENSOR FUSION IN DEEP LEARNING ACCELERATOR WITH INTEGRATED RANDOM ACCESS MEMORYG06N 3/063, G06N 3/08, G06N 3/09, G06N 3/0464, H10W 90/291, H10W 90/00, H10W 90/297, G06F 3/0604, G06F 3/0659, G06F 3/0679, G06F 7/4983, G06F 13/1668, G06F 15/16, G06N 3/04Filed as Micron Technology, Inc.2026-06-05Poorna Kale | pending |
| VECTOR INDEX REGISTERS IN VECTOR PROCESSORS THAT EACH STORE MULTIPLE ADDRESSES FOR ACCESSING MULTIPLE POSITIONS IN VECTORSG06F 9/30036, G06F 9/30101, G06F 9/3013, G06F 9/30038, G06F 9/30021, G06F 9/30043, G06F 9/355, G06F 15/8053, G06F 15/8076Filed as Micron Technology, Inc.2026-06-05Steven Jeffrey Wallach | pending |
| VERIFYING SECURE SOFTWARE IMAGES USING DIGITAL CERTIFICATESG06F 21/575, H04L 9/3263, H04L 9/0825, H04L 9/0894, H04L 9/3247Filed as Micron Technology, Inc.2026-06-05Zhan Liu | pending |
| PARTIAL BLOCKS WORD LINE READ OFFSETSG06F 3/0619, G06F 3/0659, G06F 3/0679Filed as Micron Technology, Inc.2026-06-05Christina Papagianni | pending |
| DYNAMIC MEMORY REFRESH INTERVAL TO REDUCE BANDWIDTH PENALTYG11C 11/40611, G11C 11/40615, G06F 3/0619, G06F 3/0653, G06F 3/0673Filed as Micron Technology, Inc.2026-06-05Gil Golov | pending |
| TRACK ACTIVITIES OF ENDPOINTS HAVING SECURE MEMORY DEVICES FOR SECURITY OPERATIONS DURING IDENTITY VALIDATIONH04W 12/069, G06F 12/1408, H04W 12/126, H04W 12/61, H04W 12/63, H04W 12/71, G06F 21/107, G06F 12/1433, G06F 21/602, G06F 21/79Filed as Micron Technology, Inc.2026-06-05Jeffrey Charles Shiner | pending |
| END-TO-END QUALITY OF SERVICE MANAGEMENT FOR MEMORY DEVICEG06F 3/0611, G06F 3/0659, G06F 3/0604, G06F 3/0613, G06F 3/0635, G06F 3/0679Filed as MICRON TECHNOLOGY, INC.2026-06-04Muthazhagan Balasubramani | pending |
| SEMICONDUCTOR DEVICE ASSEMBLIES AND SYSTEMS WITH IMPROVED THERMAL PERFORMANCE AND METHODS FOR MAKING THE SAMEH10W 90/00, H10W 40/254, H10W 40/22, H10W 40/25, H10W 90/701, H10W 90/732, H10W 40/253, H10W 74/15, H10W 95/00, H10W 74/142, H10W 72/20, H10W 74/00, H10W 90/724, H10W 90/288, H10W 90/722, H10W 90/734, H10W 74/01, H10W 74/117, H10W 40/226Filed as Micron Technology, Inc.2026-06-04Hyunsuk Chun | pending |
| NAND DETECT EMPTY PAGE SCANG11C 16/0483, G11C 16/16, G11C 7/04, G11C 11/5635, G11C 13/0035, G11C 16/08, G11C 16/3404, G11C 16/3495Filed as Micron Technology, Inc.2026-06-04Christina PAPAGIANNI | pending |
| SELF-SUPPORTING SGD STADIUMH10B 43/10, H10B 41/20, G11C 16/0483, H10B 43/50, H10B 43/20, H10B 41/30, H10B 43/35, H10B 41/35, H10B 41/40, H10B 43/30, H10B 43/40, H10B 41/27, H10B 43/27Filed as Micron Technology, Inc.2026-06-04Anna Maria Conti | pending |
| ENHANCED VALLEY TRACKING WITH TRIM SETTING UPDATES IN A MEMORY DEVICEG11C 11/4096, G11C 29/028, G11C 11/4085, G11C 11/4094, G11C 29/021, G11C2207/2254Filed as Micron Technology, Inc.2026-06-03Ching-Huang Lu | pending |
| GARBAGE COLLECTION FOR FLASH TRANSLATION LAYER TABLESG06F 12/0246, G06F 12/0253, G06F 12/0292, G06F2212/7201, G06F2212/7205Filed as Micron Technology, Inc.2026-06-03Andrei Konan | pending |
| SEMICONDUCTOR DEVICES HAVING ALIGNED FRONT-END INTERFACE CONTACTS AND BACK-END INTERFACE CONTACTS, AND ASSOCIATED SYSTEMS AND METHODSH10W 90/00, H10B 80/00, H10W 20/43, H10W 72/527, H10W 72/07552, H10W 80/721, H10W 72/9445, H10W 90/754, H10W 72/5473, H10W 72/926, H10W 80/743, H10W 72/59, H10W 72/9415, H10W 90/752, H10W 90/24, G11C 5/04, G11C 5/06Filed as Micron Technology, Inc.2026-06-03Chin Hui Chong | pending |
| Partition a Tensor with Varying Granularity Levels in Shuffled Secure Multiparty ComputationG06F 9/5066, H04L 9/008, G06F 21/6254, G06F2209/5017, G06F2209/509, H04L2209/46Filed as Micron Technology, Inc.2026-06-03Andre Xian Ming Chang | pending |
| APPARATUSES AND METHODS FOR PER-ROW COUNT BASED REFRESH TARGET IDENTIFICATIONG06F 3/0632, G06F 3/0673, G11C 11/406, G06F 3/0604, G11C 11/4085, G11C 11/4087Filed as Micron Technology, Inc.2026-06-02Yang Lu | pending |
| ON-DIE TEMPERATURE CONTROL FOR SEMICONDUCTOR DIE ASSEMBLIES AND ASSOCIATED SYSTEMS AND METHODSH10N 19/00, H10W 72/011, H10W 40/10, H10N 10/17, H10N 10/01, H10W 80/334, H10W 80/339, H10W 80/754, H10W 72/923, H10W 72/90, H10W 80/312, H10W 99/00, H10W 72/01951, H10W 72/019, H10W 72/9415, H10W 40/28, H10W 80/327, H10W 90/792, H10W 80/701Filed as Micron Technology, Inc.2026-06-01Bang-Ning Hsu | pending |
| VOLATILE MEMORY TO NON-VOLATILE MEMORY INTERFACE FOR POWER MANAGEMENTG06F 3/0625, G06F 3/0679, Y02D 10/00, G06N 20/00, G06F 3/0634, G06F 3/068, G06F 12/0804, G06F 12/0846, G06F 12/0868, G06F 12/0888, G06F2212/1016, G06F2212/1028, G06F2212/1032, G06F2212/205, G06F2212/214, G06F2212/502, G06F2212/603Filed as Micron Technology, Inc.2026-05-29Shivam Swami | pending |
| DATA CHARACTERISTIC-BASED ERROR CORRECTION SYSTEMS AND METHODSG06F 11/1048, G06F 11/1068, G06N 3/0499, G06F 11/1012, G06F 13/1668, G06N 3/061, G06N 3/08, G06N 3/088Filed as Micron Technology, Inc.2026-05-28Fa-Long Luo | pending |
| CROSS-POINT MEMORY ARRAY WITH ACCESS LINESH10B 63/84, H10B 63/845, G11C 13/0004, H10N 70/826, H10B 63/24, H10N 70/231, H10B 63/22, H10B 63/20, H10B 63/82, H10N 70/20, H10N 70/8825, H10N 70/235, H10B 53/20, H10B 63/80, H10N 70/063, H10N 70/245, H10N 70/011, H10B 63/10, H10N 70/882, G11C2213/71, G11C2213/77Filed as Micron Technology, Inc.2026-05-28Hernan A. Castro | pending |
| APPARATUSES AND METHODS FOR TRACKING WORD LINE ACCESSESG11C 11/4076, G11C 11/4085, G11C 11/406, G11C 11/40622Filed as Micron Technology, Inc.2026-05-27Yuan He | pending |
| DATA GROUP SYNCHRONIZATIONG06F 16/27, G06F 16/242Filed as Micron Technology, Inc.2026-05-27David A. ROBERTS | pending |
| SUPPORTING MULTIPLE ACTIVE REGIONS IN MEMORY DEVICESG06F 3/061, G06F 3/0656, G06F 3/0604, G06F 3/064, G06F 3/0659, G06F 3/0679, G06F 3/0688Filed as Micron Technology, Inc.2026-05-26Luca Bert | pending |
| METHODS OF FORMING MICROELECTRONIC DEVICESH10B 12/30, H10B 12/03, H10B 12/482, H10B 12/05, H10B 12/50, H10B 12/488, H10W 20/20, H10W 90/297Filed as Micron Technology, Inc.2026-05-26Si-Woo Lee | pending |
| MEMORY DEVICESH10B 80/00, G11C 11/4085, H10B 12/482, H10B 12/485, H10B 12/00, H10B 12/50, H10B 12/315, G11C 11/4091, G11C 11/4097Filed as Micron Technology, Inc.2026-05-26Fatma Arzum Simsek-Ege | pending |
| MEMORY DEVICESH10B 43/27, H10B 41/27, H10W 20/063, H10W 20/072, H10W 20/46, H10W 10/20, H10W 10/021, H10W 20/0633Filed as Micron Technology, Inc.2026-05-26Pengyuan Zheng | pending |
| METHOD FOR SUBSTRATE MOISTURE NCF VOIDING ELIMINATIONH10W 42/00, H10W 74/012, H10W 74/01, H10W 74/137, H10W 74/15, H10W 90/00, H10W 74/00, H10W 74/47, H10W 90/721Filed as Micron Technology, Inc.2026-05-22Brandon P. Wirz | pending |
| WAFER-ON-WAFER MEMORY DEVICE ARCHITECTURESG11C 5/063, G11C 29/022, H10B 80/00, H10W 80/00, H10W 90/00, H10W 20/435, G11C 16/0483, G11C 16/08, G11C2029/0411Filed as Micron Technology, Inc.2026-05-22Kitae Park | pending |
| MEMORY CELL CAPACITOR STRUCTURES FOR THREE-DIMENSIONAL MEMORY ARRAYSH10B 12/30, H10B 12/315, H10B 12/03, H10B 12/50, H10B 12/488, H10B 12/09, G11C 5/02Filed as Micron Technology, Inc.2026-05-22Sheyang Ning | pending |
| POWER CONTROL CHAING11C 5/148, G11C 11/4074, G11C 5/14, G11C 11/413Filed as Micron Technology, Inc.2026-05-22Leon Zlotnik | pending |
| Wearable Electronic Device with Built-in Intelligent Monitoring Implemented using Deep Learning Accelerator and Random Access MemoryG06F 1/163, G06N 3/063, G06N 3/09, G06N 3/0464, G06N 3/092, G06F 17/16, G06N 3/08, G06T 1/20Filed as Micron Technology, Inc.2026-05-22Poorna Kale | pending |
| VALLEY SEARCH IN READ ERROR RECOVERY FOR A MEMORY DEVICE USING LOW-DENSITY PARITY CHECK SYNDROME WEIGHT AND AUTO-READ CALIBRATIONG06F 11/1016, G06F 11/1068, G06F 11/1048Filed as Micron Technology, Inc.2026-05-22Zhengang Chen | pending |
| CORRECTION MATRIX RESETG06F 11/1004, G06F 11/1068, G06F 17/16, G06F 1/24, G06F 11/1012Filed as Micron Technology, Inc.2026-05-22Leon Zlotnik | pending |
| BIN-BASED READ ERROR HANDLING FLOWS USING A FAST CORRECTIVE READ OPERATIONG06F 11/1016, G06F 11/1048, G06F 11/073, G06F 11/076, G06F 11/0793, G06F 11/1068, G11C 29/021, G11C 29/028, G11C 29/42, G11C 29/52, G11C2029/0409, G11C2029/0411Filed as Micron Technology, Inc.2026-05-22Yu-Chung Lien | pending |
| SELECTIVELY ERASING ONE OF MULTIPLE ERASE BLOCKS COUPLED TO A SAME STRING BY CREATING A PSEUDO PN JUNCTIONG11C 16/0483, G11C 16/16, G11C 16/28Filed as Micron Technology, Inc.2026-05-21Shyam Sunder Raghunathan | pending |
| ADAPTIVE SUPER BLOCK WEAR LEVELINGG06F 3/0616, G06F 3/0679, G11C 16/34, G06F 3/064, G06F 3/0652Filed as Micron Technology, Inc.2026-05-21Ying Yu Tai | pending |
| SYSTEMS AND METHODS TO SELECTIVELY CONNECT ANTENNAS TO COMMUNICATE VIA RADIO FREQUENCY SIGNALSG06K 7/10316, G06K 19/07773, G06K 7/10, G06K 19/0723, G06K 19/0725Filed as Micron Technology, Inc.2026-05-20John R. Tuttle | pending |
| RANDOMIZED OR PROGRAM-ERASE-CYCLE- DEPENDENT PROGRAM VERIFY SCHEMEG06F 21/57Filed as Micron Technology, Inc.2026-05-20Yu-Chung LIEN | pending |
| WRITE OPERATIONS ON A NUMBER OF PLANESG06F 3/0659, G06F 12/0246, G06F 3/0604, G06F 3/064, G06F 3/0679, G06F 12/1027, G06F2212/7203, G06F2212/7208Filed as Micron Technology, Inc.2026-05-20Tom V. Geukens | pending |
| PERFORMING MODULATION OPERATIONS IN A MEMORY SUB-SYSTEMG06F 3/0616, G06F 3/0638, G06F 3/0679Filed as Micron Technology, Inc.2026-05-19Prashanth Reddy Enukonda | pending |
| APPARATUSES AND METHODS FOR SINGLE AND MULTI MEMORY CELL ARCHITECTURESG11C 11/4091, G11C 11/4093, G11C 11/4097Filed as Micron Technology, Inc.2026-05-19Yang Lu | pending |
| READ MARGIN HEALTH EVALUATIONS FOR MEMORY SYSTEMSG11C 11/40615, G11C 11/4074, G11C 11/40622Filed as Micron Technology, Inc.2026-05-19Yee Yang Tay | pending |
| MEMORY DEVICE WITH INDEPENDENT PLATE LINE CONTROLG06F 11/2733, G11C 29/76Filed as Micron Technology, Inc.2026-05-18Makoto Kitagawa | pending |
| READ VOLTAGE LEVEL BIN SELECTIONG11C 16/26, G11C 16/30, G11C 16/0483, G11C 16/102, G11C 29/021, G11C 29/028, G11C2207/2254Filed as Micron Technology, Inc.2026-05-18Eric N. Lee | pending |
| APPARATUS INCLUDING MULTIPLE HIGH BANDWIDTH MEMORY CUBESG11C 5/02, H10B 80/00, H10W 90/00, H10W 90/297Filed as Micron Technology, Inc.2026-05-18Lingming Yang | pending |
| SEMICONDUCTOR DIE STACKS AND ASSOCIATED SYSTEMS AND METHODSH10B 80/00, H10W 90/00, H10W 72/942, H10W 80/334, H10W 20/0245, H10W 20/481, H10W 72/923, H10W 72/952, H10W 72/953, H10W 80/00, H10W 20/0234, H10W 20/20, H10W 72/90, H10W 72/951, H10W 80/312, H10W 99/00, H10W 20/2134, H10W 72/0198, H10W 20/484, H10W 72/9415, H10W 74/111, H10W 80/327, H10W 20/023, H10W 90/792, H10W 72/934, H10W 72/071, H10W 20/0242, H10W 20/0253Filed as Micron Technology, Inc.2026-05-18Hernan A. Castro | pending |
| MEMORY SUBSYSTEM SUPPORTED QUALITY OF SERVICE LEVELS FOR VIRTUALIZED STORAGEG06F 9/45558, G06F 12/08, G06F 12/1009, G06F 3/061, G06F 3/0659, G06F 3/0665, G06F 3/0679, G06F 9/5077, G06F 12/1036, G06F 12/109, G06F 13/1689, G06F2009/45579, G06F2009/45583, G06F2212/1016, G06F2212/1048, G06F2212/152, G06F2212/651, G06F2212/657Filed as Micron Technology, Inc.2026-05-18Prateek Sharma | pending |
| INTELLIGENT INTERACTIVE VIDEO CONTENT BASED ON CONTEXTUAL AWARENESS FOR MOBILE APPLICATIONSH04N 21/25891, H04N 21/2668, H04N 21/23418, H04N 21/251, H04N 21/4532, H04N 21/8456Filed as Micron Technology, Inc.2026-05-18Chiara Cerafogli | pending |
| Memory Arrays Comprising Strings Of Memory Cells And Methods Used In Forming A Memory Array Comprising Strings Of Memory CellsH10B 43/27, H10B 43/10, H10B 41/27Filed as Micron Technology, Inc.2026-05-15Alyssa N. Scarbrough | pending |
| SUBSTRATE FOR VERTICALLY ASSEMBLED SEMICONDUCTOR DIESH10W 90/00, H10W 90/291, H10W 72/823, H10W 72/801, H10W 90/22, H10W 90/724, H10W 90/754Filed as Micron Technology, Inc.2026-05-15Kunal R. Parekh | pending |
| ASSOCIATING KEY-VALUE PAIR SETS WITH LEAF NODESG06F 3/0622, G06F 3/0655, G06F 3/0679Filed as Micron Technology, Inc.2026-05-15Gregory Alan BECKER | pending |
| MICROELECTRONIC DEVICES INCLUDING ISOLATION STRUCTURES, AND RELATED SYSTEMSH10B 43/50, H10B 43/10, H10B 41/50, H10B 41/10, H10B 41/27, H10B 43/27Filed as Micron Technology, Inc.2026-05-15Sidhartha Gupta | pending |
| CONFIGURATION OF MEMORY SERVICES OF A DATA STORAGE DEVICE TO A HOST SYSTEMG06F 12/0246, G06F 12/0815Filed as Micron Technology, Inc.2026-05-14Luca Bert | pending |
| BLOCK STATUS PARITY DATA IN MEMORYG06F 11/1048, G06F 11/1076, G06F 12/0246, G11C 29/42Filed as Micron Technology, Inc.2026-05-13John M. Gonzales | pending |
| MANAGED MEMORY DEVICE WITH INTEGRATED RADIO-FREQUENCY IDENTIFICATION COMPONENT FOR CRYPTOGRAPHIC TRACKINGH04L 9/3247, G16H 10/60, G16H 20/13, H04L 9/0825, H04L 9/0866, H04L 9/3278, H04L2209/805, H04L2209/88Filed as Micron Technology, Inc.2026-05-13Giuseppe PRINCIPATO | pending |
| Integrated Assemblies and Methods of Forming Integrated AssembliesH10B 41/50, H10B 43/10, H10B 43/27, H10B 43/50, H10B 43/35, H10B 41/35, H10B 43/40, H10B 41/27, H10B 41/41Filed as Micron Technology, Inc.2026-05-12Alyssa N. Scarbrough | pending |
| READ OPERATION WITH CAPACITY USAGE DETECTION SCHEMEG11C 16/28, G11C 11/5642, G11C 16/0483, G11C 16/08, G11C 16/24, G11C 16/26Filed as Micron Technology, Inc.2026-05-12Yu-Chung Lien | pending |
| DETECTING DATA BUS DRIVE FAULTSG06F 11/1048, G06F 11/1076Filed as Micron Technology, Inc.2026-05-11Melissa I. Uribe | pending |
| ERROR TRACKING BY A MEMORY SYSTEMG06F 11/0727, G06F 11/0787Filed as Micron Technology, Inc.2026-05-11Sai Krishna Mylavarapu | pending |
| CORRECTING LATCH UPSET EVENTS IN A TRIM REGISTERG06F 11/1016, G11C 29/56, G06F 11/0772Filed as Micron Technology, Inc.2026-05-11John M. Gonzales | pending |
| MEMORY DEVICESH10W 90/00, H10B 12/482, H10B 12/485, H10B 12/33, H10B 12/033, H10B 12/315, H10B 12/488, H10B 12/036, H10W 72/07331, H10W 90/732, H10W 72/073, H10W 72/353, H10W 72/01Filed as Micron Technology, Inc.2026-05-08Fatma Arzum Simsek-Ege | pending |
| STORING DATA ON MULTI-LEVEL CELL MEMORY CELLSG06F 3/0679, G06F 3/0604, G06F 3/061, G06F 3/0655Filed as Micron Technology, Inc.2026-05-08Roy Leonard | pending |
| MEMORY DEVICES INCLUDING STAIRCASE STRUCTURES AND MERGED SOURCE TIER STRUCTURESH10B 43/10, H10W 20/031, H10W 20/20, H10B 43/50, H10B 41/50, H10B 41/10, H10B 43/40, H10B 41/27, H10B 43/27, H10B 41/41, H10W 20/056, H10W 20/435Filed as Micron Technology, Inc.2026-05-08Shuangqiang Luo | pending |
| MEMORY WITH FAIL INDICATORS, INCLUDING MEMORY WITH LED FAIL INDICATORS, AND ASSOCIATED SYSTEMS, DEVICES, AND METHODSG06F 11/0772Filed as Micron Technology, Inc.2026-05-07Aaron Jannusch | pending |
| MICROELECTONIC DEVICES AND MEMORY DEVICESH10W 90/00, G11C 7/18, H10B 12/482, H10B 12/485, H10B 12/33, H10B 12/488, H10B 12/036, H10D 88/00, H10D 88/01, H10D 84/038, H10W 72/07331, H10W 80/00, H10W 99/00, H10W 90/792, G11C 8/14Filed as Micron Technology, Inc.2026-05-07Fatma Arzum Simsek-Ege | pending |
| NEUROMORPHIC MEMORY DEVICE AND METHODH10W 90/00, G06F 13/1668, G06N 3/09, G06N 3/065, G06N 3/0499, H10W 90/297, H10W 90/754, H10W 90/752, H10W 90/24, G06N 3/004, G06N 3/08, G11C 5/025, G11C 7/1006, G11C 7/16, G11C 11/54Filed as Micron Technology, Inc.2026-05-07Brent Keeth | pending |
| SEMICONDUCTOR MEMORY DEVICE-DIRECTED ERROR CHECK AND SCRUBG06F 11/1016, G06F 11/1068, G06F 11/2736, G06F 11/1048, G06F 11/106, G06F 11/26, G11C 11/406, G11C 29/42, G11C 29/56, G11C2211/4062Filed as Micron Technology, Inc.2026-05-07Sujeet Ayyapureddi | pending |
| MEMORY DEVICE WITH A STORAGE COMPONENTG11C 29/52, G11C 29/4401, G11C 29/76, G11C 29/785Filed as Micron Technology, Inc.2026-05-07Lingming Yang | pending |
| APPARATUSES INCLUDING STIFFENER DEVICESH05K 1/0271, H05K2201/09418, H05K2201/10159Filed as Micron Technology, Inc.2026-05-07Prasad Nagavenkata Nune | pending |
| AUDIO AND VISUAL INPUT ANALYSISG06N 20/00, A61B 5/165, G16H 20/30, G16H 30/20, G16H 50/70, G16H 30/40, G16H 20/70, A61B 5/4803Filed as Micron Technology, Inc.2026-05-06Yunju Lee | pending |
| WAFER-ON-WAFER FORMED MEMORY AND LOGICG06F 13/1673, G06F 13/28, G11C 11/4093, G16B 50/10, G16B 30/00, H10P 54/00, H10P 74/203, H10W 72/221, H10W 72/07252, H10W 80/00, H10W 80/721, H10W 90/00, H10W 90/26, H10W 72/90, H10W 80/312, H10W 90/20, H10W 72/20, H10W 99/00, H10W 72/50, H10W 90/297, H10W 90/724, H10W 80/327, H10W 90/288, H10W 90/721, H10W 90/752, H10W 90/792, H10W 72/01, H10W 90/751, G06F 3/0656, G06F2213/28, G11C 5/025, G11C 5/063, G11C 7/08, G11C 7/1012, G11C 7/1039, G11C 11/4087, G11C 11/4091, G11C 11/4096Filed as Micron Technology, Inc.2026-05-05Sean S. Eilert | pending |
| LOOKUP TABLE FOR CONTIGUOUS PAGE DETECTION IN LIVE MIGRATIONG06F 12/0246, G06F 13/1668, G06F 12/0292, G06F2212/657, G06F2212/7201Filed as MICRON TECHNOLOGY, INC.2026-05-05Hua Ye | pending |
| ANALOG COMPUTING CONFIGURED MEMORYG06F 3/0611, G06N 20/00, G06N 3/065, G06F 3/0659, G06F 3/0679, G06N 3/08Filed as Micron Technology, Inc.2026-05-05Shashank Bangalore Lakshman | pending |
| DEALLOCATION OF A MEMORY DEVICE WITH A SEGMENTED MAPPING TABLEG06F 3/0659, G06F 12/0246, G06F 3/0604, G06F 3/0673, G06F 12/0292, G06F2212/7201Filed as MICRON TECHNOLOGY, INC.2026-05-05Andrei Konan | pending |
| EXOTHERMIC REACTIVE BONDING FOR SEMICONDUCTOR DIE ASSEMBLIES AND ASSOCIATED SYSTEMS AND METHODSH10W 90/00, H10W 99/00, H10W 72/07337, H10W 72/073, H10W 72/931, H10W 72/952, H10W 80/00, H10W 72/90, H10W 72/951, H10W 80/312, H10W 90/297, H10W 90/792Filed as Micron Technology, Inc.2026-05-04Kyle K. Kirby | pending |
| VALLEY CHECK MEMORY SYSTEM COMMANDG06F 11/1068, G06F 11/076, G06F 11/1016Filed as Micron Technology, Inc.2026-05-04Charles S. Kwong | pending |
| SEMICONDUCTOR DEVICE ASSEMBLY INTERCONNECTION PILLARS AND ASSOCIATED METHODSH10W 72/072, H10W 72/20, H10W 72/983, H10W 72/07236, H10W 72/234, H10W 72/255, H10W 72/223, H10W 90/722, H10W 72/252Filed as Micron Technology, Inc.2026-05-04Andrew M. Bayless | pending |
| TEMPERATURE-BASED READ ERROR HANDLER FOR MEMORY SYSTEMG06F 3/0619, G06F 3/0653, G06F 3/0679Filed as Micron Technology, Inc.2026-05-04Srinivasa Reddy Kunduru | pending |
| EFFICIENT EMPTY PAGE SCAN OPERATIONSG11C 16/26, G11C 16/3445, G11C 16/10, G11C 16/16, G11C 16/3418Filed as Micron Technology, Inc.2026-05-04Lei Lin | pending |
| PARALLEL BLOCK FOLDING WITH ERROR CORRECTIONG06F 11/0793Filed as Micron Technology, Inc.2026-05-04Hanchao Chai | pending |
| POWER ENVELOPE MODIFICATION FOR MEMORY SYSTEMS BASED ON TIME TO THERMAL THROTTLEG06F 1/206, G06F 1/3275, Y02D 10/00, G06F 1/3203, G06F 1/3225, G06F 1/324, G06F 1/3296Filed as Micron Technology, Inc.2026-05-01Cory M. Steinmetz | pending |
| EXCEPTION LIST COMPRESSION FOR LOGICAL-TO-PHYSICAL TABLESG06F 12/0246, G06F2212/1044, G06F2212/401, G06F2212/7201Filed as Micron Technology, Inc.2026-05-01David Aaron PALMER | pending |
| ACCESS LINE VOLTAGE RAMP RATE ADJUSTMENTG11C 16/102, G11C 16/3459, G11C 11/5628, G11C 16/0483, G11C 16/10, G11C 16/12Filed as Micron Technology, Inc.2026-04-30Yu-Chung Lien | pending |
| DETERMINING DATA MIGRATION PRIORITIES IN A MEMORY SUB-SYSTEMG06F 3/0613, G06F 3/0647, G06F 3/0679, G06F 11/102, G06F 11/1048, G11C 29/44Filed as Micron Technology, Inc.2026-04-30Juane Li | pending |
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