← Every company
Carl Zeiss Meditec AG Patents
What Carl Zeiss Meditec AG has filed at the patent office — applications as well as grants, because a filing is on the record eighteen months before anyone has to say what it was for.
CZMWY on carbonthat →Filings on file
67
Granted
0
Still pending
67
Filed under
10 names
67 filings
Newest filing first. A pending application has no patent number yet, and most never get one.
| Invention | Patent |
|---|---|
| MEDICAL OPTICAL SYSTEM, DATA PROCESSING SYSTEM, COMPUTER PROGRAM, AND NON-VOLATILE COMPUTER-READABLE STORAGE MEDIUMA61B 1/000094, G16H 10/40, G16H 30/20, G16H 50/20, A61B 1/000096, A61B 1/043, A61B 1/0653, A61B 5/0062, A61B 5/0071, A61B 5/7267Filed as Carl Zeiss Meditec AG2026-06-15Christoph Hauger | pending |
| METHOD AND APPARATUSES FOR DISPOSING OF EXCESS MATERIAL OF A PHOTOLITHOGRAPHIC MASKG03F 1/72, G03F 1/82, B08B 6/00, B08B 7/026, G03F 7/70925Filed as Carl Zeiss SMT GmbH2026-06-11Michael Budach | pending |
| SYSTEM AND METHOD FOR INSPECTING A MASK FOR EUV LITHOGRAPHYG01N 21/956, G03F 1/84, G01N 21/8806, G01N2021/95676Filed as Carl Zeiss SMT GmbH2026-06-03Renzo Capelli | pending |
| Method and device for microscopyG02B 21/361, G02B 21/365, G02B 21/367, G02B 27/0025Filed as Carl Zeiss Microscopy GmbH2026-05-22Joerg Steinert | pending |
| DISTORTION OPTIMIZED MULTI-BEAM SCANNING SYSTEMH01J 37/1477, H01J 37/153, H01J2237/1504, H01J2237/1516, H01J2237/1518, H01J2237/1536Filed as Carl Zeiss MultiSEM GmbH2026-05-21Dirk ZEIDLER | pending |
| MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH IMPROVED DETECTION SYSTEM FOR SECONDARY ELECTRON IMAGING OVER A LARGE RANGE OF LANDING ENERGIES OF PRIMARY ELECTRONSH01J 37/244, H01J 37/28, H01J 37/145, H01J 37/147, H01J 37/153, H01J 37/265, H01J2237/1532, H01J2237/2448, H01J2237/2806, H01J2237/2809, H01J2237/2826Filed as Carl Zeiss MultiSEM GmbH2026-05-21Felix MENKE | pending |
| Method for the Ordinal Classification of a Microscope Image and Microscopy SystemG06V 10/764, G06T 7/0002, G06T 7/62, G06V 20/698, G06V 10/82, G06V 10/98, G06T 3/40, G06T2207/10056, G06T2207/20081, G06T2207/20084, G06T2207/30024, G06T2207/30168Filed as Carl Zeiss Microscopy GmbH2026-05-20Manuel Amthor | pending |
| OPTICAL SYSTEM, IN PARTICULAR FOR CHARACTERIZING A MICROLITHOGRAPHY MASKG02B 27/142, G03F 1/84, G03F 7/70058, G01N 21/8806, G01N2021/95676, G02B 1/10, G02B 27/10, G02B 27/14, G03F 7/2004, G03F 7/70133, G03F 7/70191, G03F 7/70233Filed as Carl Zeiss SMT GmbH2026-05-11Ulrich Matejka | pending |
| METHOD FOR PRODUCING A SURFACE COATING WHICH REFLECTS EUV RADIATIONG03F 1/24, G21K 1/062, G21K2201/067Filed as Carl Zeiss SMT GmbH2026-05-08Sebastian STROBEL | pending |
| Generation of Measurement Strategy for Measuring a Measurement ObjectG01B 21/00, G05B 19/401, G06F 30/27, G06N 3/09, G06N 3/0455, G06N 3/0464, G06N 3/0442, G01B 5/008, G01B 11/005, G01B 21/04, G05B2219/37439, G05B2219/37441, G05B2219/37443, G05B2219/37448, G06N 3/088Filed as Carl Zeiss Industrielle Messtechnik GmbH2026-05-07Rolf Häring | pending |
| MULTI-BEAM CHARGED PARTICLE MICROSCOPE FOR INSPECTION WITH REDUCED CHARGING EFFECTSH01J 37/026, H01J 37/265, H01J 37/28, H01J2237/0044, H01J2237/2803, H01J2237/2817Filed as Carl Zeiss MultiSEM GmbH2026-05-05Stefan SCHUBERT | pending |
| GENERALIZED IMAGE RESTORATION WITH SYNTHETIC PRIOR FOR SPARSE-VIEW COMPUTED TOMOGRAPHYG06T 5/70, G06T 12/20, G06T 7/12, G16H 30/40, G06V 10/82, G06T 5/60, G06T 5/10, G06T 15/08, G06T2207/10081, G06T2207/20081, G06T2207/20084Filed as CARL ZEISS X-RAY MICROSCOPY, INC.2026-05-05Matthew ANDREW | pending |
| MODULAR METROLOGY APPARATUS FOR INTERCHANGEABLE PROCESS MODULESH01J 37/16, G01B 11/14, H01J 37/28, H01J2237/0245, H01J2237/166, H01J2237/24578, H01J2237/2801, H01J2237/31713Filed as Carl Zeiss SMT GmbH2026-05-04Patrick Hengsberger | pending |
| ADAPTIVE OPTICAL MODULE FOR A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUSG02B 26/0825, G01B 7/16, G02B 26/06, G02B 26/0833, G03F 7/70266, G03F 7/70525, G03F 7/70533, G03F 7/70825, G03F 7/7085, G03F 7/7095, G03F 7/70991Filed as Carl Zeiss SMT GmbH2026-04-30Toralf GRUNER | pending |
| COMPENSATION OF OPERATIONALLY INDUCED THERMAL DEFORMATIONS IN THE MANUFACTURING PROCESS OF AN OPTICAL ELEMENT UNDER THERMAL CONTROL DURING OPERATIONB29D 11/00932, G01B 11/255, G02B 27/0012, G06F2119/08, G06F 30/10, B29D 11/00009, B29D 11/00432, B29D 11/00951, G02B 5/0891, G02B 7/028, G03F 7/70266, G03F 7/70316, G03F 7/70591, G03F 7/70891Filed as Carl Zeiss SMT GmbH2026-04-29Johannes SCHURER-KOCH | pending |
| METHODS AND DEVICES FOR DETERMINING AT LEAST ONE REFRACTIVE VALUEA61B 3/103, A61B 3/0025, A61B 3/0033, A61B 3/028, A61B 3/032, A61B 3/036, G02C 7/027Filed as Carl Zeiss Vision International GmbH2026-04-28Alexander Leube | pending |
| COMPUTER-IMPLEMENTED METHOD AND APPARATUS FOR PROCESSING A SAMPLE USING A NANOMANIPULATORG01Q 10/06, G03F 1/82, B82Y 35/00, G01Q 30/02, G01Q 60/38, G01Q 80/00Filed as Carl Zeiss SMT GmbH2026-04-24Christof Baur | pending |
| COMPUTER-IMPLEMENTED METHOD AND APPARATUS FOR PROCESSING A SAMPLE WITH A NANOMANIPULATORG03F 7/706837, G01Q 80/00, G03F 1/82, G03F 7/706851, G03F 7/70655, B82Y 35/00, G01Q 30/04, G03F 1/72, G03F 7/7065, G03F 7/70975Filed as Carl Zeiss SMT GmbH2026-04-24Christof Baur | pending |
| OPTICAL ELEMENT AND EUV LITHOGRAPHY SYSTEMG02B 5/0891, G03F 7/70233, G02B 5/0816, G03F 7/702, G03F 7/70316, G03F 7/70916Filed as Carl Zeiss SMT GmbH2026-04-21Peter HUBER | pending |
| OPTICAL SYSTEM FOR GUIDING ILLUMINATION AND IMAGING LIGHT FROM A LIGHT SOURCE TO AN IMAGE FIELDG02B 5/283, G03F 7/70575, H10P 34/00, G02B 7/006, G03F 7/70008, G03F 7/70125, G03F 7/70191, G03F 7/70308, G03F 7/70316, G03F 7/70825Filed as Carl Zeiss SMT GmbH2026-04-21Michael CARL | pending |
| METHOD AND APPARATUS FOR DETERMINING AT LEAST ONE REFRACTIVE VALUE OF AN EYEA61B 3/032, A61B 3/036, G02C 7/027Filed as Carl Zeiss Vision International GmbH2026-04-20Tobias Buehren | pending |
| EQUIPMENT AND METHODS FOR REFRACTIVE SURGERY, PARTICULARLY FOR KERATOPLASTYA61F 2/148, A61F 9/00831, A61F 2/142, A61F 2/147, A61F 9/00804, A61F 9/0081, A61F 9/00812, A61F2009/00853, A61F2009/00855, A61F2009/00872, A61F2009/00878, A61F2009/00882, A61F2240/001, A61F2240/004Filed as Carl Zeiss Meditec AG2026-04-08Mark BISCHOFF | pending |
| COMPONENT FOR A SYSTEM OF SEMICONDUCTOR TECHNOLOGY AND METHOD FOR PRODUCING A COMPONENT FOR A SYSTEM OF SEMICONDUCTOR TECHNOLOGYG03F 7/70508, G03F 7/70541, G03F 7/70225, G03F 7/707, G03F 7/70975, G06K 19/0723Filed as Carl Zeiss SMT GmbH2026-04-06Arvid MACZEYZIK | pending |
| PARTICLE BEAM SYSTEMH01J 37/244, H01J 37/09, H01J 37/24, H01J 37/28, H01J2237/0266, H01J2237/2443, H01J2237/2445, H01J2237/24495, H01J2237/2605Filed as Carl Zeiss Microscopy GmbH2026-04-02Gero Walter | pending |
| MICROLITHOGRAPHIC PROJECTION EXPOSURE SYSTEMG03F 7/70891, G03F 7/70825, G03F 7/70841, G03F 7/70975Filed as Carl Zeiss SMT GmbH2026-04-02Alexander VOELTER | pending |
| MEASUREMENT SYSTEM, MEASUREMENT METHOD WITH THE AID OF SUCH A MEASUREMENT SYSTEM, AND PROJECTION EXPOSURE APPARATUS COMPRISING SUCH A MEASUREMENT SYSTEMG03F 7/70075, G03F 7/70833, G03F 7/7085, G02B 26/0833, G03F 7/70116, G03F 7/70141, G03F 7/70233, G03F 7/70316Filed as Carl Zeiss SMT GmbH2026-03-31Martin ENDRES | pending |
| OPTICAL SYSTEM FOR A PROJECTION EXPOSURE APPARATUS, AND METHOD FOR SPECIFYING AN ILLUMINATION PUPILG02B 27/0081, G03F 7/70075, G03F 7/70116, G02B 26/0833, G03F 7/70091, G03F 7/70141, G03F 7/702, G03F 7/7025, G03F 7/70516, G03F 7/7085Filed as Carl Zeiss SMT GmbH2026-03-30Alexander Winkler | pending |
| TRANSPORT AND TEST SYSTEM FOR A CAMERA, METHOD FOR TESTING A CAMERAH04N 17/002, H04N 23/51, H04N 23/12, H04N 23/54, H04N 23/56, G01N 21/8806, G01N 33/0027Filed as Carl Zeiss SMT GmbH2026-03-30Lutz Brekerbohm | pending |
| OPTICAL DEVICE FOR MODIFYING A LIGHT BEAMG02B 21/006, G02B 15/143, G02B 21/06, G02B 27/0961, G02B 27/0988Filed as Carl Zeiss Microscopy GmbH2026-03-27Ralf Netz | pending |
| ILLUMINATION OPTICAL UNIT, AND METHOD FOR MEASURING A DEPENDENCE OF AN INTENSITY OF ILLUMINATION LIGHT, INCIDENT ON AN OBJECT FIELD, ON AT LEAST ONE DETECTION OBJECT FIELD COORDINATE USING SUCH AN ILLUMINATION OPTICAL UNITG03F 7/70133, G03F 7/7085, G02B 26/0833, G03F 7/70075, G03F 7/70116, G03F 7/702Filed as Carl Zeiss SMT GmbH2026-03-26Martin ENDRES | pending |
| FACET MIRROR FOR AN ILLUMINATION OPTICAL UNIT FOR PROJECTION LITHOGRAPHY SUITABLE FOR USE AS FIRST FACET MIRRORG03F 7/70075, G03F 7/70116, G02B 26/0833, G03F 7/702Filed as Carl Zeiss SMT GmbH2026-03-26Martin ENDRES | pending |
| METHOD FOR MANUFACTURING A SPECTACLE LENS COMPRISING A STRUCTURED COATING AND SPECTACLE LENSB29D 11/00009, B29D 11/00442, G02B 1/14, G02B 1/18, B29C 35/0805, B29C2035/0827, B29D 11/00346, B29D 11/00865, G02B 1/111, G02B 1/118Filed as Carl Zeiss Vision International GmbH2026-03-26Waiz Karim | pending |
| ILLUMINATION OPTICAL UNIT FOR PROJECTION LITHOGRAPHY, AND METHOD FOR MONITORING SUCH AN ILLUMINATION OPTICAL UNITG03F 7/70075, G03F 7/7085, H10P 76/00, G02B 26/0833, G03F 7/70116, G03F 7/70133, G03F 7/70141Filed as Carl Zeiss SMT GmbH2026-03-26Michael RAMOLLA | pending |
| METHOD FOR PRODUCING AN OPTICAL SYSTEM FOR A LITHOGRAPHY APPARATUS, SUBSTRATE FOR AN OPTICAL COMPONENT OF A LITHOGRAPHY APPARATUS, AND LITHOGRAPHY APPARATUSB28D 7/005, G03F 7/70891, B28D 1/22, G02B 5/0891, G03F 7/706, G03F 7/70958, G03F 7/70975Filed as Carl Zeiss SMT GmbH2026-03-26Norman BAER | pending |
| HIGH-RESOLUTION LOW-DISTORTION IMAGING USING CHARGED-PARTICLE SCANNING MICROSCOPEG06V 10/24, H01J 37/263, G06T 5/73, G06T 5/50, G06T2207/10061, G06T2207/30148, H01J 37/222, H01J 37/28, H01J 37/3056Filed as Carl Zeiss SMT GmbH2026-03-25Dmitry KLOCHKOV | pending |
| Microscope and Microscopy MethodG02B 21/082, G01N 21/01, G01N 21/6458, G01N2021/6463, G02B 21/02, G02B 21/365Filed as Carl Zeiss Microscopy GmbH2026-03-25Eva Simbuerger | pending |
| METHOD FOR OPERATING A MULTIPLE PARTICLE BEAM SYSTEM, CALIBRATION METHOD FOR A MULTIPLE PARTICLE BEAM SYSTEM, COMPUTER PROGRAM PRODUCT AND MULTIPLE PARTICLE BEAM SYSTEM WITH INCREASED PERFORMANCEH01J 37/1474, H01J 37/21, H01J 37/222, H01J 37/28, H01J2237/216, H01J2237/221, H01J2237/28, H01J2237/2801Filed as Carl Zeiss MultiSEM GmbH2026-03-24Christof RIEDESEL | pending |
| Projection Exposure Apparatus for Semiconductor Lithography Comprising a Connecting ElementG03F 7/709, G03F 7/70991, F16L 27/107, G03F 7/70216Filed as Carl Zeiss SMT GmbH2026-03-24Timo SPEIDEL | pending |
| STABILIZATION OF A REPAIRED REGION OF AN OBJECT FOR LITHOGRAPHYG03F 1/74Filed as Carl Zeiss SMT GmbH2026-03-24Daniel Rhinow | pending |
| PARTICLE BEAM MICROSCOPEH01J 37/265, H01J 37/14, H01J 37/21, H01J 37/244, H01J2237/04735, H01J2237/04922, H01J2237/24507Filed as Carl Zeiss Microscopy GmbH2026-03-23Bjoern GAMM | pending |
| MULTI-BEAM GENERATING UNIT WITH INCREASED FOCUSING POWERH01J 37/12, H01J 37/1477, H01J 37/09, H01J 37/28, H01J2237/0453, H01J2237/1516, H01J2237/28Filed as Carl Zeiss MultiSEM GmbH2026-03-23Alexander HUEBEL | pending |
| METHOD FOR OPERATING A PARTICLE BEAM APPARATUS, COMPUTER PROGRAM PRODUCT AND PARTICLE BEAM APPARATUS FOR CARRYING OUT THE METHODH01J 37/21, H01J 37/244, H01J 37/28, H01J2237/2448Filed as Carl Zeiss Microscopy GmbH2026-03-22Mr. Bernd Hafner | pending |
| METHOD FOR ADJUSTING A FLUORESCENCE IMAGE INTENSITY, AND FLUORESCENCE MICROSCOPEG02B 21/0076, G02B 21/0032, G02B 21/0072, G02B 21/008Filed as Carl Zeiss Microscopy GmbH2026-03-19Tim Dietz | pending |
| LAMINATING DEVICE AND METHOD FOR LAMINATING A FUNCTIONAL FOIL ONTO A SURFACE OF AN OPTICAL ELEMENTB29D 11/0073, B29D 11/00009, B29D 11/00951, G02B 1/04Filed as Carl Zeiss Vision International GmbH2026-03-19Hao Pan | pending |
| CERTAIN IMPROVEMENTS OF MULTI-BEAM GENERATING AND MULTI-BEAM DEFLECTING UNITSH01J 37/1472, H01J 37/1477, H01J 37/09, H01J 37/12, H01J 37/28, H01J2237/0453, H01J2237/1205, H01J2237/1516, H01J2237/153, H01J2237/28Filed as Carl Zeiss MultiSEM GmbH2026-03-19Yanko Sarov | pending |
| PROJECTION EXPOSURE APPARATUS COMPRISING AN ELEMENT COMPRISING AN ELASTIC MATERIALG03F 7/7095, G03F 7/70958, G03F 7/70316, G03F 7/70825, G03F 7/709, G03F 7/70908, G03F 7/70983, G03F 7/70991Filed as Carl Zeiss SMT GmbH2026-03-19Julian KALLER | pending |
| Method and Device for Producing a Workpiece from a Workpiece BlankG05B 19/404, G05B 19/41815, G05B 19/4183, G05B 19/41875, G05B2219/37434, G05B2219/50041Filed as Carl Zeiss Digital Innovation GmbH2026-03-18Franz-Georg Ulmer | pending |
| METHOD FOR TRAINING A MACHINE LEARNING MODEL FOR INSTANCE SEGMENTATION, TRAINED MACHINE LEARNING MODEL, DEVICE FOR INSTANCE SEGMENTATION, SYSTEM AND COMPUTER PROGRAMG06V 10/26, G06V 10/764Filed as Carl Zeiss Microscopy GmbH2026-03-18Simon FRANCHINI | pending |
| METHOD FOR TRAINING A MACHINE LEARNING MODEL FOR INSTANCE SEGMENTATION, TRAINED MACHINE LEARNING MODEL, DEVICE FOR INSTANCE SEGMENTATION, SYSTEM AND COMPUTER PROGRAMG06V 10/774, G06V 20/695, G06V 20/698, G06V 10/26, G06V 10/776, G06V 10/764Filed as Carl Zeiss Microscopy GmbH2026-03-18Simon FRANCHINI | pending |
| METHOD FOR OPERATING A PARTICLE BEAM DEVICE, AND PARTICLE BEAM DEVICEH01J 37/222, H01J 37/265, H01J 37/22, H01J 37/28, H01J 37/3005, H01J2237/221, H01J2237/226, H01J2237/2802, H01J2237/2809, H01J2237/2814, H01J2237/31745Filed as Carl Zeiss Microscopy GmbH2026-03-16Roland SALZER | pending |
| METHOD AND DEVICE FOR MASK REPAIRG03F 1/72, G03F 1/74, G03F 1/84Filed as Carl Zeiss SMT GmbH2026-03-16Christian Felix Hermanns | pending |
| SPECTACLE LENS COMPRISING RING-SHAPED STRUCTURES AND METHODG02C 7/022, G02C 7/024, G02C 7/066, G02C2202/24Filed as Carl Zeiss Vision International GmbH2026-03-14Padmaja Rajagopal Sankaridurg | pending |
| METHOD AND DEVICE FOR CORRECTING AN IMAGING ERROR OF A PARTICLE BEAM DURING SAMPLE PROCESSINGH01J 37/153, H01J 37/21, H01J 37/304, H01J 37/222, H01J 37/3056, H01J 37/3178, H01J2237/31732, H01J2237/31744Filed as Carl Zeiss SMT GmbH2026-03-13David Laemmle | pending |
| APOCHROMATIC IMMERSION OBJECTIVEG02B 21/02, G02B 13/006Filed as Carl Zeiss Microscopy GmbH2026-03-13Jörg SPRENGER | pending |
| METHOD FOR SECURING A MEMS MICROMIRROR UNIT AND MEMS MICROMIRROR UNITG02B 26/0833, G02B 5/0891, G02B 5/09, G02B 7/1822, G03F 7/70075, G03F 7/70825Filed as Carl Zeiss SMT GmbH2026-03-12Markus HAUF | pending |
| METHOD FOR PARTICLE BEAM-INDUCED PROCESSING OF A DEFECT OF A MICROLITHOGRAPHIC PHOTOMASKG03F 1/74, H01J 37/222, G03F 7/70608, G03F 7/70975, H01J 37/1471, H01J 37/28, H01J 37/3053, H01J2237/2817, H01J2237/30488, H01J2237/31744Filed as Carl Zeiss SMT GmbH2026-03-11Thorsten Hofmann | pending |
| METHOD AND DEVICE FOR CAPTURING IMAGES OF MICRO- AND/OR NANOSTRUCTURESG03F 1/84Filed as Carl Zeiss SMT GmbH2026-03-11Ulrich Matejka | pending |
| IMAGING OPTICAL UNITG02B 5/0891, G03F 7/702, G02B 13/08, G02B 17/0663, G03F 7/70233Filed as Carl Zeiss SMT GmbH2026-03-10Hans-Juergen Rostalski | pending |
| ILLUMINATION DEVICE FOR A LIGHT-SHEET MICROSCOPEG02B 21/08Filed as Carl Zeiss Microscopy GmbH2026-03-09Joerg SIEBENMORGEN | pending |
| SYSTEM FOR SUPPORTING A USER OF A HUNTING WEAPONA01M 31/00, F41G 1/46, F41G 3/06, A01M 31/002, F41A 17/08, F41G 1/38, F41G 1/473, F41G 3/02, F41G 3/04, F41G 3/08, F41G 3/165, G01C 21/20Filed as Carl Zeiss AG2026-03-06Alexander Tobisch | pending |
| SUPPORT STRUCTURE FOR AN ILLUMINATION OPTICAL UNIT OF A PROJECTION EXPOSURE APPARATUSG03F 7/70825, G03F 7/70833, G02B 7/182, G03F 7/7015Filed as Carl Zeiss SMT GmbH2026-03-06Björn LIEBAUG | pending |
| METHOD FOR DECONVOLUTION OF ACQUIRED RAW DATA OF AN IMAGEH04N 13/282, H04N 13/189, H04N 25/441, H04N 25/41Filed as CARL ZEISS MICROSCOPY GMBH2026-03-05Stanislav Kalinin | pending |
| METHOD AND APPARATUS FOR PROCESSING A SAMPLEG03F 1/82, G03F 1/84, B08B 7/0028, G01Q 80/00, G03F 1/72Filed as Carl Zeiss SMT GmbH2026-03-05Christof Baur | pending |
| Method for Light-Field Microscopy and Light-Field MicroscopeG02B 21/367, G02B 3/0056, G02B 21/025, G02B 21/361Filed as Carl Zeiss Microscopy GmbH2026-03-03Thomas Egloff | pending |
| Method for Microscopy and Light-Field MicroscopeG02B 21/367, G02B 3/0043, G02B 3/0056, G02B 21/02, G02B 21/086, G02B 21/14Filed as Carl Zeiss Microscopy GmbH2026-03-03Lars Loetgering | pending |
| Light-Field MicroscopeG02B 21/367, G02B 3/0043, G02B 3/0056, G02B 21/02, G02B 21/06Filed as Carl Zeiss Microscopy GmbH2026-03-03Thomas Egloff | pending |
| MEMS MICROMIRROR UNIT AND PRODUCTION THEREOFG02B 26/0833, B81C 3/004, G02B 7/182, G03F 7/70266, G03F 7/70833, G03F 7/7085Filed as Carl Zeiss SMT GmbH2026-03-03Joachim FRIEDL | pending |
Filings are matched to the company by applicant name, so a subsidiary filing under its own name is only here if that name resolves to this company. The applicant is printed as filed, which makes a wrong match visible. A patent is not a product: most applications are never granted, and most grants are never built.