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Advantest Corp Patents
What Advantest Corp has filed at the patent office — applications as well as grants, because a filing is on the record eighteen months before anyone has to say what it was for.
ATEYY on carbonthat →Filings on file
50
Granted
3
Still pending
47
Filed under
4 names
50 filings
Newest filing first. A pending application has no patent number yet, and most never get one.
| Invention | Patent |
|---|---|
| TEST APPARATUS, TEST METHOD, AND COMPUTER PROGRAM PRODUCTG01J 1/42, G01J2001/4252, G01M 11/00Filed as ADVANTEST CORPORATION2026-03-29Takashi KUSAKA | pending |
| WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTINGG01R 31/2874, G01R 31/2887, H10W 40/47, F28F2260/02, G01R 31/2856, G01R 31/2875, G01R 31/2877, G01R 31/2889, G01R 31/318511Filed as Advantest Test Solutions, Inc.2026-03-23Samer Kabbani | pending |
| HANDLING APPARATUS AND TESTING SYSTEMG01R 31/2875, G01R 31/2887, G01R 31/2865, G01R 31/2874, G01R 31/2877, G01R 31/2893Filed as ADVANTEST Corporation2026-02-19Aritomo Kikuchi | pending |
| VARIABLE ATTENUATOR, STEP ATTENUATOR, AND TEST APPARATUSG01R 1/203, G01R 1/30, G01R 1/24, H03H 11/24Filed as ADVANTEST CORPORATION2026-02-09Takahiro TSUSHIMA | pending |
| CONTROL OF AN AUTOMATED TEST EQUIPMENT BASED ON TEMPERATUREG01R 31/2834, G01R 31/2874, G01R 31/01, G01R 31/2863, G01R 31/2868, G01R 31/287Filed as ADVANTEST CORPORATION2026-01-28Jens EDELMANN | pending |
| TESTING ARRANGEMENT AND METHOD FOR DETERMINING AN OPTIMIZED DISTANCE BETWEEN A DEVICE UNDER TEST AND AN ANTENNA OF A TESTING ARRANGEMENTG01R 29/0892Filed as Advantest Corporation2025-12-18José MOREIRA | pending |
| ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURESG01R 31/2875, G01R 1/0458, G01R 31/2863, G01R 31/2867, G01R 31/2874Filed as Advantest Test Solutions, Inc.2025-12-12Karthik Ranganathan | pending |
| OPTICAL INPUT/OUTPUT APPARATUSG01R 31/311Filed as ADVANTEST Corporation2025-12-10Hideo HARA | pending |
| PATTERN-GENERATING DEVICEG11C 29/10, G11C 29/56004, G11C 29/12015, G11C 29/56Filed as ADVANTEST CORPORATION2025-12-10Tokunori AKITA | pending |
| MICROPARTICLE MEASURING APPARATUSG01N 15/132, G01N 15/12, G01N2015/138, G01N 15/13, G01N2015/0053Filed as ADVANTEST CORPORATION2025-12-09Hiroshi SATO | pending |
| MICROPARTICLE MEASURING APPARATUSG01N 15/12, G01N 15/132, G01N2015/1029, G01N2015/138, G01N2015/137, G01N 15/13, G01N2015/0053Filed as ADVANTEST CORPORATION2025-12-09Yasuharu IMAI | pending |
| INDUCTORH01F 27/28, H01F 27/24Filed as ADVANTEST Corporation2025-12-09Fumikazu TAKAYANAGI | pending |
| TEST APPARATUS, TEST METHOD, AND PROGRAMG01R 31/31813, G01R 31/318371, G11C 29/56004, G01R 31/28, G01R 31/31723, G01R 31/31727, G01R 31/31919Filed as ADVANTEST CORPORATION2025-12-05Tokunori AKITA | pending |
| TEST APPARATUS AND TEST METHODG01R 31/2879, G01R 1/206, G01R 1/30, G01R 31/2601, G01R 31/28, G01R 31/2834, G01R 31/287, G01R 31/2882Filed as ADVANTEST CORPORATION2025-11-27Hiroki KIMURA | pending |
| INTEGRATED CIRCUIT, AUTOMATED TEST EQUIPMENT AND METHOD FOR TESTING A DEVICE UNDER TEST, USING ON-CHIP CONNECTIONS BETWEEN VOLTAGE PROVIDER CIRCUITSG01R 31/31924, G01R 31/3167, G01R 31/31721, G01R 35/007Filed as Advantest Corporation2025-11-21Rudi BAUER | pending |
| MICROPARTICLE MEASURING APPARATUSG01N 15/132, G01N 15/0266, G01N2015/133, G01N2015/1029, G01N2015/1024, G01N2015/135, G01N 15/12, G01N2015/0053Filed as ADVANTEST CORPORATION2025-10-24Yasuharu IMAI | pending |
| THERMAL PREDICTION AND REGULATION DURING INTEGRATED CIRCUIT TESTINGG01R 31/2874, G01R 31/396, G06N 20/00, G01K 3/00, G01K 7/42, G01R 31/2875, G01R 31/2879Filed as ADVANTEST CORPORATION2025-09-25Frank Christian MIELKE | pending |
| TEST APPARATUS AND METHOD FOR OPERATING A TEST APPARATUSG01R 31/318307, G01R 31/318335Filed as Advantest Corporation2025-09-23Raphaël Nicolas LATTY | pending |
| CONTACTLESS TESTING OF INTERPOSERS AND SILICON BRIDGESH10P 74/207, G01R 1/07, G01R 31/2834, G01R 31/303, G01R 31/396, G01R 31/52, H10P 74/203, H10W 70/616, G01R 1/06705, G01R 1/06772, G01R 1/07307, G01R 1/07314, G01R 1/07342, G01R 31/2887, G01R 31/312Filed as Advantest Corporation2025-09-09Matthias SAUER | pending |
| PARALLEL CONTACTLESS TESTING OF INTERPOSERS AND SILICON BRIDGESG01R 31/303, G01R 31/315, G01R 1/07, G01R 1/07328, G01R 31/2834, G01R 31/2853, G01R 31/2896Filed as Advantest Corporation2025-09-09Roland RÖSSLHUBER | pending |
| SYSTEM AND METHOD FOR CALIBRATING A DEVICE-UNDER-TEST INTERFACEG01R 31/2889, G01R 35/005, G01R 23/005, G01R 23/16, G01R 31/2822Filed as Advantest Corporation2025-08-20Shoji KOJIMA | pending |
| DEVICE UNDER TEST SOCKET AND METHOD FOR TESTING A DEVICE UNDER TESTG01R 1/0466, G01R 31/2863Filed as Advantest Corporation2025-08-14José MOREIRA | pending |
| DEVICE INTERFACE AND METHOD OF ADJUSTING THE SAMEG01R 31/2889, G01R 31/31905, G01R 1/0466Filed as ADVANTEST CORPORATION2025-07-30Haokun Zhang | pending |
| BRIDGE BEAM, SEMICONDUCTOR DEVICE HANDLING APPARATUS, AND SEMICONDUCTOR DEVICE TESTING APPARATUSG01R 31/2865, G01R 31/311, G01R 1/06794, G01R 31/2863, G01R 31/2868, G01R 31/2887, G01R 31/2891Filed as ADVANTEST Corporation2025-07-17Aritomo Kikuchi | pending |
| OPTICAL COMB LIGHT SOURCE AND MEASURING APPARATUSG02F 1/113, G02F 1/0121Filed as ADVANTEST CORPORATION2025-07-16Takao SAKURAI | pending |
| TEST CIRCUIT, TEST APPARATUS AND TEST METHODG01R 31/2837, G01R 31/2841, G01R 31/2879, G01R 31/3187, G01R 1/206, G01R 31/00, G01R 31/2839, G01R 31/2863, G01R 31/31712, G01R 31/31713, G01R 31/31721, G01R 31/31813, G01R 31/3183, G01R 31/31924, G01R 31/31926, G01R 31/31928, G01R 31/31932Filed as ADVANTEST CORPORATION2025-07-11Kensuke SOEDA | pending |
| INTERFACE APPARATUSG01R 31/2863, G01R 31/2889, G01R 1/0466, G01R 31/2834, G01R 31/2891Filed as ADVANTEST CORPORATION2025-07-09Yuto MORI | pending |
| TESTING CIRCUIT, TESTING APPARATUS, AND TESTING METHODG01R 31/2837, G01R 31/2841, G01R 31/2879, G01R 31/3187, G01R 1/206, G01R 31/00, G01R 31/2839, G01R 31/2863, G01R 31/31712, G01R 31/31713, G01R 31/31721, G01R 31/31813, G01R 31/3183, G01R 31/31924, G01R 31/31926, G01R 31/31928, G01R 31/31932Filed as ADVANTEST CORPORATION2025-06-27Yusuke ASADA | pending |
| DEVICE INTERFACE AND METHOD OF TESTING USING THE SAMEG01R 1/07392, G01R 31/2889, G01R 1/0441, G01R 31/2601Filed as ADVANTEST CORPORATION2025-06-24Haokun Zhang | pending |
| REAL-TIME THROTTLING FOR TESTING OF SEMICONDUCTOR DEVICESG01R 31/2601, G01R 31/287, G01R 31/2872, G01R 31/2874Filed as Advantest Corporation2025-06-09Matthias SAUER | pending |
| PORE CHIP CASEG01N 27/44791, G01N 33/48721, G01N 15/13Filed as ADVANTEST CORPORATION2025-06-05Yasuharu IMAI | pending |
| SEMICONDUCTOR INTEGRATED CIRCUITH10W 40/22, G01R 31/2834, G01R 31/2877, H10D 84/00, H10D 84/038, H10W 90/00, H10P 74/27, H10W 40/40, G01R 31/2867Filed as ADVANTEST CORPORATION2025-05-30Junichi IKEMOTO | pending |
| LAYERED STRUCTURE AND INDUCTORH01F 1/12, H01F 27/24, H01F 3/14Filed as ADVANTEST CORPORATION2025-05-28Fumikazu TAKAYANAGI | pending |
| SWITCH APPARATUS AND TESTING APPARATUSG01R 31/2844, G01R 1/203Filed as ADVANTEST CORPORATION2025-05-26Satoshi KOYAMA | pending |
| TEMPERATURE ADJUSTING SYSTEM, CONTROLLER, DEVICE HANDLING APPARATUS, TESTER, AND DEVICE TESTING APPARATUSG01N 25/00, G05D 23/1917Filed as ADVANTEST Corporation2025-05-23Yuya Yamada | pending |
| AMPLIFIER CIRCUITH03F 3/45183, H03F 3/45475, H03F 1/18, H03F 1/32, H03F 1/3211, H03F 3/605, H03F2200/451Filed as ADVANTEST CORPORATION2025-05-19Takahiro TSUSHIMA | pending |
| OPTICAL CONNECTOR CONNECTION DETERMINING APPARATUSG01M 11/088, G02B 6/385, G01M 11/085Filed as ADVANTEST CORPORATION2025-05-19Hideo HARA | pending |
| ELECTRONIC DEVICE AND METHOD OF IDETIFYING CIRCUIT BOARD THEREOFG06V 10/764, G06T 11/00Filed as ADVANTEST CORPORATION2025-05-16Yiyun Zhang | pending |
| WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTINGG01R 31/2874, G01R 31/2887, H10W 40/47, F28F2260/02, G01R 31/2856, G01R 31/2875, G01R 31/2877, G01R 31/2889, G01R 31/318511Filed as Advantest Test Solutions, Inc.2025-05-07Samer Kabbani | 12540968 |
| WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTINGG01R 31/2874, G01R 31/2887, H10W 40/47, F28F2260/02, G01R 31/2856, G01R 31/2875, G01R 31/2877, G01R 31/2889, G01R 31/318511Filed as Advantest Test Solutions, Inc.2025-05-07Samer Kabbani | 12535522 |
| WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTINGG01R 31/2874, G01R 31/2887, H10W 40/47, F28F2260/02, G01R 31/2856, G01R 31/2875, G01R 31/2877, G01R 31/2889, G01R 31/318511Filed as Advantest Test Solutions, Inc.2025-05-07Samer Kabbani | 12540967 |
| PIN ELECTRONICS APPARATUS, TEST APPARATUS, AND METHODG01R 31/2879, G01R 31/31721, H04W 4/80, G01R 22/06, G01R 31/26, G01R 31/2834, G01R 31/31712, G01R 31/31713, G01R 31/31926, G01R 31/40, G01R 35/00Filed as ADVANTEST CORPORATION2025-04-30Takayuki TANAKA | pending |
| PIN ELECTRONICS APPARATUS, TEST APPARATUS, AND METHODG01R 31/2879, G01R 35/00, H04W 4/80, G01R 22/06, G01R 31/26, G01R 31/2889, G01R 31/3025, G01R 31/31712, G01R 31/40Filed as ADVANTEST CORPORATION2025-04-30Takayuki TANAKA | pending |
| DA CONVERSION APPARATUSH03M 1/662, H03M 1/0624Filed as ADVANTEST CORPORATION2025-04-20Jun TADA | pending |
| ELECTROMAGNETIC WAVE MEASURING APPARATUS, METHOD, AND RECORDING MEDIUMG01R 29/0878, G01R 29/0892Filed as ADVANTEST CORPORATION2025-04-04Takao SAKURAI | pending |
| SWITCH DEVICE AND TESTING DEVICEH03K 17/102, H03K 17/6871, G01R 31/2884, H03K 17/08142, H03K 17/693Filed as ADVANTEST CORPORATION2025-04-03Takahiro TSUSHIMA | pending |
| FREQUENCY STABILIZATION CIRCUIT, FREQUENCY STABILIZATION METHOD, AND OPTICAL COMB GENERATORH01S 3/067, H01S 3/1305, G02F 1/315, G02F 1/365, H01S 3/06712, H01S 3/0675, H01S 3/106, H01S 3/1106, H01S 3/13, H01S 3/1307, H01S 3/139Filed as ADVANTEST CORPORATION2025-04-03Takanori OKADA | pending |
| PORE DEVICEG01N 15/13, G01N 15/0266, G01N 15/12, G01N 15/1023, G01N2015/1029, G01N 15/131, G01N2015/135, G01N2015/0038, G01N2015/0053Filed as ADVANTEST CORPORATION2025-04-02Kosuke OINUMA | pending |
| PORE DEVICEG01N 15/13, G01N 15/0266, G01N 15/12, G01N 15/1023, G01N2015/103, G01N2015/1029, G01N 15/131, G01N2015/135, G01N2015/0053Filed as ADVANTEST CORPORATION2025-04-02Hoshito TAGUCHI | pending |
| ANTENNA DEVICE FOR OTA DEVICE TESTING USING AUTOMATED TEST EQUIPMENTG01R 1/045, G01R 29/0871, H01Q 13/06, G01R 31/2834, G01R 31/3025, H01P 5/107Filed as Advantest Corporation2025-03-27José Moreira | pending |
Filings are matched to the company by applicant name, so a subsidiary filing under its own name is only here if that name resolves to this company. The applicant is printed as filed, which makes a wrong match visible. A patent is not a product: most applications are never granted, and most grants are never built.
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